Elevated temperature annealing of the neutron induced leakage current and corresponding defect levels in low and high resistivity silicon detectors BNL-60273 DE94 013538 CONF-9410613

Elevated temperature annealing of the neutron induced leakage current and corresponding defect levels in low and high resistivity silicon detectors

BNL-60273 DE94 013538 CONF-9410613

Call No. (NDL): LS-DE94/013538
Bibliographic ID of National Diet Library: 000005499361

Material type: 規格・テクニカルリポート類

Author: Eremin, Vほか

Publisher: -

Publication date: 1994

Material Format: Microform

Capacity, size, etc.: 4 p. (1 microfiche)

NDC: -

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Microform

Material Type: 規格・テクニカルリポート類
Title: Elevated temperature annealing of the neutron induced leakage current and corresponding defect levels in low and high resistivity silicon detectors
Author/Editor: Eremin, V
Ivanov, A
Verbitskaya, E
Li, Z
Kraner, H. W
Publication Date: 1994
Publication Date (W3CDTF): 1994
Extent: 4 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : BNL-60273
テクニカルリポート番号 : DE94 013538
テクニカルリポート番号 : CONF-9410613
Holding library: 国立国会図書館
Call No.: LS-DE94/013538
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005499361
http://id.ndl.go.jp/bib/000005499361
Bibliographic Record Category (NDL): 291