High-resolution millimeter-wave imaging system for defect characterization in dielectric slabs ANL/ET/CP-81718 DE94 016300 CONF-94072311

High-resolution millimeter-wave imaging system for defect characterization in dielectric slabs

ANL/ET/CP-81718 DE94 016300 CONF-94072311

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Material Type: 規格・テクニカルリポート類
Title: High-resolution millimeter-wave imaging system for defect characterization in dielectric slabs
Author/Editor: Bakhtiari, S
Gopalsami, N
Raptis, A. C
Lepper, M. J
Publication Date: 1994
Publication Date (W3CDTF): 1994
Extent: 11 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : ANL/ET/CP-81718
テクニカルリポート番号 : DE94 016300
テクニカルリポート番号 : CONF-94072311
Holding library: 国立国会図書館
Call No.: LS-DE94/016300
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005499395
http://id.ndl.go.jp/bib/000005499395
Bibliographic Record Category (NDL): 291