Texture analysis of critical current density in Bi(sub 2)Sr(sub 2)CaCu(sub 2)O(sub x) tapes ANL/ET/CP-83715 DE94 018375 CONF-9409261

Texture analysis of critical current density in Bi(sub 2)Sr(sub 2)CaCu(sub 2)O(sub x) tapes

ANL/ET/CP-83715 DE94 018375 CONF-9409261

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Material Type: 規格・テクニカルリポート類
Title: Texture analysis of critical current density in Bi(sub 2)Sr(sub 2)CaCu(sub 2)O(sub x) tapes
Author/Editor: Biondo, A. C
Kallend, J. S
Wu, C. T
Knapp, W. L
Lanagan, M. T
Publication Date: 1994
Publication Date (W3CDTF): 1994
Extent: 16 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : ANL/ET/CP-83715
テクニカルリポート番号 : DE94 018375
テクニカルリポート番号 : CONF-9409261
Holding library: 国立国会図書館
Call No.: LS-DE94/018375
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005503796
http://id.ndl.go.jp/bib/000005503796
Bibliographic Record Category (NDL): 291