Microscopic origins of metastable effects in a-Si:H and deep defect characterization in a-Si,Ge:H alloys. Final subcontract report, February 1, 1991--January 31, 1994. Progress rept NREL/TP-451-7163 DE94 011887

Microscopic origins of metastable effects in a-Si:H and deep defect characterization in a-Si,Ge:H alloys. Final subcontract report, February 1, 1991--January 31, 1994. Progress rept

NREL/TP-451-7163 DE94 011887

Call No. (NDL): LS-DE94/011887
Bibliographic ID of National Diet Library: 000005505029

Material type: 規格・テクニカルリポート類

Author: Cohen, J. D

Publisher: -

Publication date: 1994

Material Format: Microform

Capacity, size, etc.: 45 p. (1 microfiche)

NDC: -

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Material Type: 規格・テクニカルリポート類
Title: Microscopic origins of metastable effects in a-Si:H and deep defect characterization in a-Si,Ge:H alloys. Final subcontract report, February 1, 1991--January 31, 1994. Progress rept
Author/Editor: Cohen, J. D
Publication Date: 1994
Publication Date (W3CDTF): 1994
Extent: 45 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : NREL/TP-451-7163
テクニカルリポート番号 : DE94 011887
Holding library: 国立国会図書館
Call No.: LS-DE94/011887
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005505029
http://id.ndl.go.jp/bib/000005505029
Bibliographic Record Category (NDL): 291