規格・テクニカルリポート類

Evolution of oxidation and creep damage mechanisms in HIPed silicon nitride materials CONF-940865-4 DE95 001360

Icons representing 規格・テクニカルリポート類

Evolution of oxidation and creep damage mechanisms in HIPed silicon nitride materials

CONF-940865-4 DE95 001360

Call No. (NDL)
LS-DE95/001360
Bibliographic ID of National Diet Library
000005505441
Material type
規格・テクニカルリポート類
Author
Wereszczak, A. Aほか
Publisher
-
Publication date
1994
Material Format
Microform
Capacity, size, etc.
14 p. (1 microfiche)
NDC
-
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Microform

Material Type
規格・テクニカルリポート類
Author/Editor
Wereszczak, A. A
Ferber, M. K
Kirkland, T. P
More, K. L
Publication Date
1994
Publication Date (W3CDTF)
1994
Extent
14 p. (1 microfiche)
Note (Material Type)
[microform]
Report No.
テクニカルリポート番号 : CONF-940865-4
テクニカルリポート番号 : DE95 001360
Holding library
国立国会図書館
Call No.
LS-DE95/001360