Defect classes - an overdue paradigm for CMOS IC testing SAND-94-2009C DE94 018905 CONF-94101941

Defect classes - an overdue paradigm for CMOS IC testing

SAND-94-2009C DE94 018905 CONF-94101941

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Material Type: 規格・テクニカルリポート類
Title: Defect classes - an overdue paradigm for CMOS IC testing
Author/Editor: Hawkins, C. F
Soden, J. M
Righter, A. W
Ferguson, F. J
Publication Date: 1994
Publication Date (W3CDTF): 1994
Extent: 13 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : SAND-94-2009C
テクニカルリポート番号 : DE94 018905
テクニカルリポート番号 : CONF-94101941
Holding library: 国立国会図書館
Call No.: LS-DE94/018905
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005507824
http://id.ndl.go.jp/bib/000005507824
Bibliographic Record Category (NDL): 291