規格・テクニカルリポート類

Influence of oxidation on radiation hardness of silicon detectors BNL-60905 DE95 002466 CONF-93071634

Icons representing 規格・テクニカルリポート類

Influence of oxidation on radiation hardness of silicon detectors

BNL-60905 DE95 002466 CONF-93071634

Call No. (NDL)
LS-DE95/002466
Bibliographic ID of National Diet Library
000005508661
Material type
規格・テクニカルリポート類
Author
Kraner, H. Wほか
Publisher
-
Publication date
1993
Material Format
Microform
Capacity, size, etc.
9 p. (1 microfiche)
NDC
-
View All

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Microform

Material Type
規格・テクニカルリポート類
Author/Editor
Kraner, H. W
Li, Z
Lazanu, S
Biggeri, U
Borchi, E
Publication Date
1993
Publication Date (W3CDTF)
1993
Extent
9 p. (1 microfiche)
Note (Material Type)
[microform]
Report No.
テクニカルリポート番号 : BNL-60905
テクニカルリポート番号 : DE95 002466
テクニカルリポート番号 : CONF-93071634
Holding library
国立国会図書館
Call No.
LS-DE95/002466