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規格・テクニカルリポート類

Influence of oxidation on radiation hardness of silicon detectors BNL-60905 DE95 002466 CONF-93071634

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Influence of oxidation on radiation hardness of silicon detectors

BNL-60905 DE95 002466 CONF-93071634

Call No. (NDL)
LS-DE95/002466
Bibliographic ID of National Diet Library
000005508661
Material type
規格・テクニカルリポート類
Author
Kraner, H. Wほか
Publisher
-
Publication date
1993
Material Format
Microform
Capacity, size, etc.
9 p. (1 microfiche)
NDC
-
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Microform

Material Type
規格・テクニカルリポート類
Author/Editor
Kraner, H. W
Li, Z
Lazanu, S
Biggeri, U
Borchi, E
Publication Date
1993
Publication Date (W3CDTF)
1993
Extent
9 p. (1 microfiche)
Note (Material Type)
[microform]
Report No.
テクニカルリポート番号 : BNL-60905
テクニカルリポート番号 : DE95 002466
テクニカルリポート番号 : CONF-93071634
Holding library
国立国会図書館
Call No.
LS-DE95/002466