X-ray diffraction characterization of defect behavior in nanocrystalline nickel during annealing ANL/MSD/CP-82603 DE95 002992 CONF-9410391

X-ray diffraction characterization of defect behavior in nanocrystalline nickel during annealing

ANL/MSD/CP-82603 DE95 002992 CONF-9410391

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Material Type: 規格・テクニカルリポート類
Title: X-ray diffraction characterization of defect behavior in nanocrystalline nickel during annealing
Author/Editor: Eastman, J. A
Beno, M. A
Knapp, G. S
Thompson, L. J
Publication Date: 1994
Publication Date (W3CDTF): 1994
Extent: 5 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : ANL/MSD/CP-82603
テクニカルリポート番号 : DE95 002992
テクニカルリポート番号 : CONF-9410391
Holding library: 国立国会図書館
Call No.: LS-DE95/002992
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005511372
http://id.ndl.go.jp/bib/000005511372
Bibliographic Record Category (NDL): 291