Quantitative X-ray microanalysis for the study of nanometer-scale phases in the AEM CONF-931108-112 DE95 006623

Quantitative X-ray microanalysis for the study of nanometer-scale phases in the AEM

CONF-931108-112 DE95 006623

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Material Type: 規格・テクニカルリポート類
Title: Quantitative X-ray microanalysis for the study of nanometer-scale phases in the AEM
Author/Editor: Anderson, I. M
Bentley, J
Carter, C. B
Publication Date: 1993
Publication Date (W3CDTF): 1993
Extent: 7 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : CONF-931108-112
テクニカルリポート番号 : DE95 006623
Holding library: 国立国会図書館
Call No.: LS-DE95/006623
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005517576
http://id.ndl.go.jp/bib/000005517576
Bibliographic Record Category (NDL): 291