OBIC analysis of stressed, thermally-isolated polysilicon resistors SAND-94-2464C DE95 008511 CONF-9504321

OBIC analysis of stressed, thermally-isolated polysilicon resistors

SAND-94-2464C DE95 008511 CONF-9504321

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Material Type: 規格・テクニカルリポート類
Title: OBIC analysis of stressed, thermally-isolated polysilicon resistors
Author/Editor: Cole, E. I
Peterson, K. A
Campbell, A. N
Snyder, E. S
Pierce, D. G
Publication Date: 1994
Publication Date (W3CDTF): 1994
Extent: 10 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : SAND-94-2464C
テクニカルリポート番号 : DE95 008511
テクニカルリポート番号 : CONF-9504321
Holding library: 国立国会図書館
Call No.: LS-DE95/008511
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005518169
http://id.ndl.go.jp/bib/000005518169
Bibliographic Record Category (NDL): 291