Band gap measurement of Si1-xCx/Si (0(le)x(le)0.014) alloys using photoluminescence and spectroscopic ellipsometry SAND-94-2718C DE95 011020 CONF-9504128

Band gap measurement of Si1-xCx/Si (0(le)x(le)0.014) alloys using photoluminescence and spectroscopic ellipsometry

SAND-94-2718C DE95 011020 CONF-9504128

Call No. (NDL): LS-DE95/011020
Bibliographic ID of National Diet Library: 000005520636

Material type: 規格・テクニカルリポート類

Author: Lee, Hほか

Publisher: -

Publication date: 1995

Material Format: Microform

Capacity, size, etc.: 6 p. (1 microfiche)

NDC: -

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Microform

Material Type: 規格・テクニカルリポート類
Title: Band gap measurement of Si1-xCx/Si (0(le)x(le)0.014) alloys using photoluminescence and spectroscopic ellipsometry
Author/Editor: Lee, H
Kurtz, S. R
Floro, J. A
Strane, J
Seager, C. H
Publication Date: 1995
Publication Date (W3CDTF): 1995
Extent: 6 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : SAND-94-2718C
テクニカルリポート番号 : DE95 011020
テクニカルリポート番号 : CONF-9504128
Holding library: 国立国会図書館
Call No.: LS-DE95/011020
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005520636
http://id.ndl.go.jp/bib/000005520636
Bibliographic Record Category (NDL): 291