Soft x-ray scanning microtomography with submicron resolution ANL/XFD/CP-82883 DE95 011817 CONF-94071455

Soft x-ray scanning microtomography with submicron resolution

ANL/XFD/CP-82883 DE95 011817 CONF-94071455

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Material Type: 規格・テクニカルリポート類
Title: Soft x-ray scanning microtomography with submicron resolution
Author/Editor: McNulty, I
Haddad, W. S
Trebes, J. E
Anderson, E. H
Publication Date: 1994
Publication Date (W3CDTF): 1994
Extent: 11 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : ANL/XFD/CP-82883
テクニカルリポート番号 : DE95 011817
テクニカルリポート番号 : CONF-94071455
Holding library: 国立国会図書館
Call No.: LS-DE95/011817
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005522734
http://id.ndl.go.jp/bib/000005522734
Bibliographic Record Category (NDL): 291