Automated laser scatter detection of surface and subsurface defects in Si3N4 components ANL/ET/CP-85328 DE95 013498 CONF-95012910

Automated laser scatter detection of surface and subsurface defects in Si3N4 components

ANL/ET/CP-85328 DE95 013498 CONF-95012910

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Material Type: 規格・テクニカルリポート類
Title: Automated laser scatter detection of surface and subsurface defects in Si3N4 components
Author/Editor: Steckenrider, J. S
Publication Date: 1995
Publication Date (W3CDTF): 1995
Extent: 16 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : ANL/ET/CP-85328
テクニカルリポート番号 : DE95 013498
テクニカルリポート番号 : CONF-95012910
Holding library: 国立国会図書館
Call No.: LS-DE95/013498
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005523001
http://id.ndl.go.jp/bib/000005523001
Bibliographic Record Category (NDL): 291