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規格・テクニカルリポート類

Sensitivity and offset calibration for the beam position monitors at the Advanced Photon Source ANL/ASD/CP-85066 DE95 013732 CONF-950512274

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Sensitivity and offset calibration for the beam position monitors at the Advanced Photon Source

ANL/ASD/CP-85066 DE95 013732 CONF-950512274

Call No. (NDL)
LS-DE95/013732
Bibliographic ID of National Diet Library
000005535471
Material type
規格・テクニカルリポート類
Author
Chung, Yほか
Publisher
-
Publication date
1995
Material Format
Microform
Capacity, size, etc.
4 p. (1 microfiche)
NDC
-
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Microform

Material Type
規格・テクニカルリポート類
Author/Editor
Chung, Y
Barr, D
Decker, G
Evans, K
Kahana, E
Publication Date
1995
Publication Date (W3CDTF)
1995
Extent
4 p. (1 microfiche)
Note (Material Type)
[microform]
Report No.
テクニカルリポート番号 : ANL/ASD/CP-85066
テクニカルリポート番号 : DE95 013732
テクニカルリポート番号 : CONF-950512274
Holding library
国立国会図書館
Call No.
LS-DE95/013732