Electron and optical beam testing of integrated circuits using CIVA, LIVA, and LECIVA SAND-95-1946C DE95 017570 CONF-95081591

Electron and optical beam testing of integrated circuits using CIVA, LIVA, and LECIVA

SAND-95-1946C DE95 017570 CONF-95081591

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Material Type: 規格・テクニカルリポート類
Title: Electron and optical beam testing of integrated circuits using CIVA, LIVA, and LECIVA
Author/Editor: Cole, E. I
Publication Date: 1995
Publication Date (W3CDTF): 1995
Extent: 20 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : SAND-95-1946C
テクニカルリポート番号 : DE95 017570
テクニカルリポート番号 : CONF-95081591
Holding library: 国立国会図書館
Call No.: LS-DE95/017570
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005536648
http://id.ndl.go.jp/bib/000005536648
Bibliographic Record Category (NDL): 291