Non-invasive current and voltage imaging techniques for integrated circuits using scanning probe microscopy. Final report, LDRD Project FY93 and FY94. PROGRESS REPT SAND-95-0758 DE95 013857

Non-invasive current and voltage imaging techniques for integrated circuits using scanning probe microscopy. Final report, LDRD Project FY93 and FY94. PROGRESS REPT

SAND-95-0758 DE95 013857

Call No. (NDL): LS-DE95/013857
Bibliographic ID of National Diet Library: 000005537923

Material type: 規格・テクニカルリポート類

Author: Campbell, A. Nほか

Publisher: -

Publication date: 1995

Material Format: Microform

Capacity, size, etc.: 37 p. (1 microfiche)

NDC: -

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Microform

Material Type: 規格・テクニカルリポート類
Title: Non-invasive current and voltage imaging techniques for integrated circuits using scanning probe microscopy. Final report, LDRD Project FY93 and FY94. PROGRESS REPT
Author/Editor: Campbell, A. N
Cole, E. I
Tangyunyong, P
Publication Date: 1995
Publication Date (W3CDTF): 1995
Extent: 37 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : SAND-95-0758
テクニカルリポート番号 : DE95 013857
Holding library: 国立国会図書館
Call No.: LS-DE95/013857
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005537923
http://id.ndl.go.jp/bib/000005537923
Bibliographic Record Category (NDL): 291