Effects of reliability screens of MOS charge trapping SAND-95-0514C DE95 017838 CONF-95091071

Effects of reliability screens of MOS charge trapping

SAND-95-0514C DE95 017838 CONF-95091071

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Material Type: 規格・テクニカルリポート類
Title: Effects of reliability screens of MOS charge trapping
Author/Editor: Shanneyfelt, M. R
Winokur, P. S
Fleetwood, D. M
Schwank, J. R
Reber, R. A. Jr
Publication Date: 1995
Publication Date (W3CDTF): 1995
Extent: 10 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : SAND-95-0514C
テクニカルリポート番号 : DE95 017838
テクニカルリポート番号 : CONF-95091071
Holding library: 国立国会図書館
Call No.: LS-DE95/017838
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005538471
http://id.ndl.go.jp/bib/000005538471
Bibliographic Record Category (NDL): 291