Spectroscopic ellipsometry and band structure of Si1(minus)y)Cy alloys grown pseudomorphically on Si (001) IS-M-825 DE96 000212 CONF-95041254

Spectroscopic ellipsometry and band structure of Si1(minus)y)Cy alloys grown pseudomorphically on Si (001)

IS-M-825 DE96 000212 CONF-95041254

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Material Type: 規格・テクニカルリポート類
Title: Spectroscopic ellipsometry and band structure of Si1(minus)y)Cy alloys grown pseudomorphically on Si (001)
Author/Editor: Zollner, S
Herzinger, C. M
Woollam, J. A
Iyer, S. S
Powell, A. P
Publication Date: 1995
Publication Date (W3CDTF): 1995
Extent: 6 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : IS-M-825
テクニカルリポート番号 : DE96 000212
テクニカルリポート番号 : CONF-95041254
Holding library: 国立国会図書館
Call No.: LS-DE96/000212
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005538702
http://id.ndl.go.jp/bib/000005538702
Bibliographic Record Category (NDL): 291