Side impact assessment using drop testing SAE-961012

Side impact assessment using drop testing

SAE-961012

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 規格・テクニカルリポート類
Title: Side impact assessment using drop testing
Author/Editor: Reid, John D
Weins, William N
Ekstrom, Ralph E
Paulsen, Gene
McConnell, David S
Publication Date: 1996
Publication Date (W3CDTF): 1996
Extent: 12 p
Alternative Title: International congress & exposition. Detroit, Mich. Feb. 1996
Report No.: テクニカルリポート番号 : SAE-961012
Holding library: 国立国会図書館
Call No.: M-SAE-961012
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005541257
http://id.ndl.go.jp/bib/000005541257
Bibliographic Record Category (NDL): 291