In situ high voltage electron microscopy technique for the study of deformation and fracture: In multilayered materials UCRL-JC-118958 DE96 002140 CONF-95041257

In situ high voltage electron microscopy technique for the study of deformation and fracture: In multilayered materials

UCRL-JC-118958 DE96 002140 CONF-95041257

Call No. (NDL): LS-DE96/002140
Bibliographic ID of National Diet Library: 000005541536

Material type: 規格・テクニカルリポート類

Author: Wall, M. Aほか

Publisher: -

Publication date: 1995

Material Format: Microform

Capacity, size, etc.: 12 p. (1 microfiche)

NDC: -

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Microform

Material Type: 規格・テクニカルリポート類
Title: In situ high voltage electron microscopy technique for the study of deformation and fracture: In multilayered materials
Author/Editor: Wall, M. A
Barbee, T. W
Weihs, T. P
Publication Date: 1995
Publication Date (W3CDTF): 1995
Extent: 12 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : UCRL-JC-118958
テクニカルリポート番号 : DE96 002140
テクニカルリポート番号 : CONF-95041257
Holding library: 国立国会図書館
Call No.: LS-DE96/002140
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005541536
http://id.ndl.go.jp/bib/000005541536
Bibliographic Record Category (NDL): 291