Effect of N2 contamination in L3 forward/backward muon chambers DOE/ER/03069-T6 DE96 002880 LNSTR-9403

Effect of N2 contamination in L3 forward/backward muon chambers

DOE/ER/03069-T6 DE96 002880 LNSTR-9403

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Material Type: 規格・テクニカルリポート類
Title: Effect of N2 contamination in L3 forward/backward muon chambers
Author/Editor: Becker, U
Nahn, S. C
Rodin, J. P
Smith, B
Publication Date: 1994
Publication Date (W3CDTF): 1994
Extent: 13 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : DOE/ER/03069-T6
テクニカルリポート番号 : DE96 002880
テクニカルリポート番号 : LNSTR-9403
Holding library: 国立国会図書館
Call No.: LS-DE96/002880
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005542496
http://id.ndl.go.jp/bib/000005542496
Bibliographic Record Category (NDL): 291