Microdefects in nitrogen doped FZ silicon revealed by Li+ drifting LBL-37561 DE96 002559 CONF-95071723

Microdefects in nitrogen doped FZ silicon revealed by Li+ drifting

LBL-37561 DE96 002559 CONF-95071723

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Material Type: 規格・テクニカルリポート類
Title: Microdefects in nitrogen doped FZ silicon revealed by Li+ drifting
Author/Editor: Knowlton, W. B
Walton, J. T
Lee, J. S
Publication Date: 1995
Publication Date (W3CDTF): 1995
Extent: 8 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : LBL-37561
テクニカルリポート番号 : DE96 002559
テクニカルリポート番号 : CONF-95071723
Holding library: 国立国会図書館
Call No.: LS-DE96/002559
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005544610
http://id.ndl.go.jp/bib/000005544610
Bibliographic Record Category (NDL): 291