Jump to main content
規格・テクニカルリポート類

Atomic scale simulations of arsenic ion implantation and annealing in silicon UCRL-JC-122966 DE96 005390 CONF-95115542

Icons representing 規格・テクニカルリポート類

Atomic scale simulations of arsenic ion implantation and annealing in silicon

UCRL-JC-122966 DE96 005390 CONF-95115542

Call No. (NDL)
LS-DE96/005390
Bibliographic ID of National Diet Library
000005559099
Material type
規格・テクニカルリポート類
Author
Caturla, M. Jほか
Publisher
-
Publication date
1995
Material Format
Microform
Capacity, size, etc.
6 p. (1 microfiche)
NDC
-
View All

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Microform

Material Type
規格・テクニカルリポート類
Author/Editor
Caturla, M. J
Diaz de la Rubia, T
Jaraiz, M
Publication Date
1995
Publication Date (W3CDTF)
1995
Extent
6 p. (1 microfiche)
Note (Material Type)
[microform]
Report No.
テクニカルリポート番号 : UCRL-JC-122966
テクニカルリポート番号 : DE96 005390
テクニカルリポート番号 : CONF-95115542
Holding library
国立国会図書館
Call No.
LS-DE96/005390