In situ x-ray scattering study of incipient formation of porous silicon ANL/MSD/CP-86502 DE96 006510 CONF-95100717

In situ x-ray scattering study of incipient formation of porous silicon

ANL/MSD/CP-86502 DE96 006510 CONF-95100717

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Material Type: 規格・テクニカルリポート類
Title: In situ x-ray scattering study of incipient formation of porous silicon
Author/Editor: You, H
Huang, K
Yoo, S. S
Nagy, Z
Publication Date: 1995
Publication Date (W3CDTF): 1995
Extent: 11 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : ANL/MSD/CP-86502
テクニカルリポート番号 : DE96 006510
テクニカルリポート番号 : CONF-95100717
Holding library: 国立国会図書館
Call No.: LS-DE96/006510
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005559718
http://id.ndl.go.jp/bib/000005559718
Bibliographic Record Category (NDL): 291