Life-testing oxide confined VCSELs: Too good to last SAND-96-0696C DE96 006989 CONF-9601638

Life-testing oxide confined VCSELs: Too good to last

SAND-96-0696C DE96 006989 CONF-9601638

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Material Type: 規格・テクニカルリポート類
Title: Life-testing oxide confined VCSELs: Too good to last
Author/Editor: Lear, K. L
Kilcoyne, S. P
Schneider, R. P., Jr
Nevers, J. A
Publication Date: 1996
Publication Date (W3CDTF): 1996
Extent: 9 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : SAND-96-0696C
テクニカルリポート番号 : DE96 006989
テクニカルリポート番号 : CONF-9601638
Holding library: 国立国会図書館
Call No.: LS-DE96/006989
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005775502
http://id.ndl.go.jp/bib/000005775502
Bibliographic Record Category (NDL): 291