Scanning transient current study of the I-V stabilization phenomena in silicon detectors irradiated by fast neutrons BNL-62923 DE96 009695 CONF-96031561

Scanning transient current study of the I-V stabilization phenomena in silicon detectors irradiated by fast neutrons

BNL-62923 DE96 009695 CONF-96031561

Call No. (NDL): LS-DE96/009695
Bibliographic ID of National Diet Library: 000005855063

Material type: 規格・テクニカルリポート類

Author: Eremin, Vほか

Publisher: -

Publication date: 1996

Material Format: Microform

Capacity, size, etc.: 13 p. (1 microfiche)

NDC: -

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Microform

Material Type: 規格・テクニカルリポート類
Title: Scanning transient current study of the I-V stabilization phenomena in silicon detectors irradiated by fast neutrons
Author/Editor: Eremin, V
Verbitskaya, E
Li, Z
Sidorov, A
Fretwurst, E
Publication Date: 1996
Publication Date (W3CDTF): 1996
Extent: 13 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : BNL-62923
テクニカルリポート番号 : DE96 009695
テクニカルリポート番号 : CONF-96031561
Holding library: 国立国会図書館
Call No.: LS-DE96/009695
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005855063
http://id.ndl.go.jp/bib/000005855063
Bibliographic Record Category (NDL): 291