High resolution electron microscopy study of the [Sigma]11 (113)/[110] symmetric tilt grain boundary in pure Al and Al-1.5 wt% Cu UCRL-JC-123185 DE96 009321 CONF-96040115

High resolution electron microscopy study of the [Sigma]11 (113)/[110] symmetric tilt grain boundary in pure Al and Al-1.5 wt% Cu

UCRL-JC-123185 DE96 009321 CONF-96040115

Call No. (NDL): LS-DE96/009321
Bibliographic ID of National Diet Library: 000005855269

Material type: 規格・テクニカルリポート類

Author: Campbell, G. Hほか

Publisher: -

Publication date: 1996

Material Format: Microform

Capacity, size, etc.: 8 p. (1 microfiche)

NDC: -

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Microform

Material Type: 規格・テクニカルリポート類
Title: High resolution electron microscopy study of the [Sigma]11 (113)/[110] symmetric tilt grain boundary in pure Al and Al-1.5 wt% Cu
Author/Editor: Campbell, G. H
King, W. E
Wien, W. L
Foiles, S. M
Publication Date: 1996
Publication Date (W3CDTF): 1996
Extent: 8 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : UCRL-JC-123185
テクニカルリポート番号 : DE96 009321
テクニカルリポート番号 : CONF-96040115
Holding library: 国立国会図書館
Call No.: LS-DE96/009321
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005855269
http://id.ndl.go.jp/bib/000005855269
Bibliographic Record Category (NDL): 291