Near-edge x-ray absorption fine structure examination of chemical bonding in sputter deposited boron and boron-nitride films UCRL-JC-123925 DE96 010243 CONF-96040123

Near-edge x-ray absorption fine structure examination of chemical bonding in sputter deposited boron and boron-nitride films

UCRL-JC-123925 DE96 010243 CONF-96040123

Call No. (NDL): LS-DE96/010243
Bibliographic ID of National Diet Library: 000005855286

Material type: 規格・テクニカルリポート類

Author: Jankowski, A. Fほか

Publisher: -

Publication date: 1996

Material Format: Microform

Capacity, size, etc.: 6 p. (1 microfiche)

NDC: -

View All

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Microform

Material Type: 規格・テクニカルリポート類
Title: Near-edge x-ray absorption fine structure examination of chemical bonding in sputter deposited boron and boron-nitride films
Author/Editor: Jankowski, A. F
Hayes, J. P
Suthreland, D. G. J
Publication Date: 1996
Publication Date (W3CDTF): 1996
Extent: 6 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : UCRL-JC-123925
テクニカルリポート番号 : DE96 010243
テクニカルリポート番号 : CONF-96040123
Holding library: 国立国会図書館
Call No.: LS-DE96/010243
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005855286
http://id.ndl.go.jp/bib/000005855286
Bibliographic Record Category (NDL): 291