Porous silicon structural evolution from in-situ luminescence and Raman measurements SAND-96-0169C DE96 010750 CONF-96040124

Porous silicon structural evolution from in-situ luminescence and Raman measurements

SAND-96-0169C DE96 010750 CONF-96040124

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Material Type: 規格・テクニカルリポート類
Title: Porous silicon structural evolution from in-situ luminescence and Raman measurements
Author/Editor: Tallant, D. R
Kelly, M. J
Guilinger, T. R
Simpson, R. L
Publication Date: 1996
Publication Date (W3CDTF): 1996
Extent: 10 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : SAND-96-0169C
テクニカルリポート番号 : DE96 010750
テクニカルリポート番号 : CONF-96040124
Holding library: 国立国会図書館
Call No.: LS-DE96/010750
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005855416
http://id.ndl.go.jp/bib/000005855416
Bibliographic Record Category (NDL): 291