Structure factor measurement in TiAl and silicon ANL/MSD/CP-89508 DE96 012710 CONF-95081634

Structure factor measurement in TiAl and silicon

ANL/MSD/CP-89508 DE96 012710 CONF-95081634

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Material Type: 規格・テクニカルリポート類
Title: Structure factor measurement in TiAl and silicon
Author/Editor: Swaminathan, S
Wiezorek, J. M
Jones, I. P
Zaluzec, N. J
Fraser-
Publication Date: 1996
Publication Date (W3CDTF): 1996
Extent: 4 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : ANL/MSD/CP-89508
テクニカルリポート番号 : DE96 012710
テクニカルリポート番号 : CONF-95081634
Holding library: 国立国会図書館
Call No.: LS-DE96/012710
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005857436
http://id.ndl.go.jp/bib/000005857436
Bibliographic Record Category (NDL): 291