New approach to texture measurements: Orientation distribution function (ODF) determination by Rietveld refinement LA-UR-96-2820 DE96 014572

New approach to texture measurements: Orientation distribution function (ODF) determination by Rietveld refinement

LA-UR-96-2820 DE96 014572

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Material Type: 規格・テクニカルリポート類
Title: New approach to texture measurements: Orientation distribution function (ODF) determination by Rietveld refinement
Author/Editor: Vondreele, R
Larson, A
Lawson, A
Sheldon, R
Wright, S
Publication Date: 1996
Publication Date (W3CDTF): 1996
Extent: 6 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : LA-UR-96-2820
テクニカルリポート番号 : DE96 014572
Holding library: 国立国会図書館
Call No.: LS-DE96/014572
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005858683
http://id.ndl.go.jp/bib/000005858683
Bibliographic Record Category (NDL): 291