Accelerated life-time testing and resistance degradation of thin-film decoupling capacitors SAND-96-2055C DE96 014072 CONF-9608942

Accelerated life-time testing and resistance degradation of thin-film decoupling capacitors

SAND-96-2055C DE96 014072 CONF-9608942

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 規格・テクニカルリポート類
Title: Accelerated life-time testing and resistance degradation of thin-film decoupling capacitors
Author/Editor: Al-Shareef, H
Dimos, D
Publication Date: 1996
Publication Date (W3CDTF): 1996
Extent: 6 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : SAND-96-2055C
テクニカルリポート番号 : DE96 014072
テクニカルリポート番号 : CONF-9608942
Holding library: 国立国会図書館
Call No.: LS-DE96/014072
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005858784
http://id.ndl.go.jp/bib/000005858784
Bibliographic Record Category (NDL): 291