Failure analysis of a half-micron CMOS IC technology SAND-96-2216C DE96 015013 CONF-9611803

Failure analysis of a half-micron CMOS IC technology

SAND-96-2216C DE96 015013 CONF-9611803

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Material Type: 規格・テクニカルリポート類
Title: Failure analysis of a half-micron CMOS IC technology
Author/Editor: Liang, A. Y
Tangyunyong, P
Bennett, R. S
Flores, R. S
Publication Date: 1996
Publication Date (W3CDTF): 1996
Extent: 12 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : SAND-96-2216C
テクニカルリポート番号 : DE96 015013
テクニカルリポート番号 : CONF-9611803
Holding library: 国立国会図書館
Call No.: LS-DE96/015013
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005860147
http://id.ndl.go.jp/bib/000005860147
Bibliographic Record Category (NDL): 291