Electronic sputtering and desorption effects in TOF-SIMS studies using slow highly charged ions like Au(sup 69+) UCRL-JC-125358 DE97 050166 CONF-96092801

Electronic sputtering and desorption effects in TOF-SIMS studies using slow highly charged ions like Au(sup 69+)

UCRL-JC-125358 DE97 050166 CONF-96092801

Call No. (NDL): LS-DE97/050166
Bibliographic ID of National Diet Library: 000005862785

Material type: 規格・テクニカルリポート類

Author: Schenkel, Tほか

Publisher: -

Publication date: 1996

Material Format: Microform

Capacity, size, etc.: 6 p. (1 microfiche)

NDC: -

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Microform

Material Type: 規格・テクニカルリポート類
Title: Electronic sputtering and desorption effects in TOF-SIMS studies using slow highly charged ions like Au(sup 69+)
Author/Editor: Schenkel, T
Briere, M. A
Schmidt-Boecking, H
Bethge, K
Schneider, D
Publication Date: 1996
Publication Date (W3CDTF): 1996
Extent: 6 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : UCRL-JC-125358
テクニカルリポート番号 : DE97 050166
テクニカルリポート番号 : CONF-96092801
Holding library: 国立国会図書館
Call No.: LS-DE97/050166
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005862785
http://id.ndl.go.jp/bib/000005862785
Bibliographic Record Category (NDL): 291