XRAYL: a program for producing idealized powder diffraction line profiles from overlapped powder patterns ORNL/TM-13272 DE97 050348

XRAYL: a program for producing idealized powder diffraction line profiles from overlapped powder patterns

ORNL/TM-13272 DE97 050348

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Material Type: 規格・テクニカルリポート類
Title: XRAYL: a program for producing idealized powder diffraction line profiles from overlapped powder patterns
Author/Editor: Hubbard, C. R
Morosin, B
Stewart, J. M
Publication Date: 1996
Publication Date (W3CDTF): 1996
Extent: 45 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : ORNL/TM-13272
テクニカルリポート番号 : DE97 050348
Holding library: 国立国会図書館
Call No.: LS-DE97/050348
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005867005
http://id.ndl.go.jp/bib/000005867005
Bibliographic Record Category (NDL): 291