Microstructure-interface-property relationships in nanometer-period x-ray multilayers. Thesis (Ph.D.) LBL-35119 DE97 004232

Microstructure-interface-property relationships in nanometer-period x-ray multilayers. Thesis (Ph.D.)

LBL-35119 DE97 004232

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Material Type: 規格・テクニカルリポート類
Title: Microstructure-interface-property relationships in nanometer-period x-ray multilayers. Thesis (Ph.D.)
Author/Editor: Nguyen, T. D
Publication Date: 1996
Publication Date (W3CDTF): 1996
Extent: 194 p. (2 microfiches)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : LBL-35119
テクニカルリポート番号 : DE97 004232
Holding library: 国立国会図書館
Call No.: LS-DE97/004232
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005867041
http://id.ndl.go.jp/bib/000005867041
Bibliographic Record Category (NDL): 291