Critical issues for the application of integrated MEMS/CMOS technologies to inertial measurement units SAND-97-0525C DE97 003845 CONF-9703245

Critical issues for the application of integrated MEMS/CMOS technologies to inertial measurement units

SAND-97-0525C DE97 003845 CONF-9703245

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Material Type: 規格・テクニカルリポート類
Title: Critical issues for the application of integrated MEMS/CMOS technologies to inertial measurement units
Author/Editor: Smith, J. H
Ellis, J. R
Montague, S
Allen, J. J
Publication Date: 1997
Publication Date (W3CDTF): 1997
Extent: 7 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : SAND-97-0525C
テクニカルリポート番号 : DE97 003845
テクニカルリポート番号 : CONF-9703245
Holding library: 国立国会図書館
Call No.: LS-DE97/003845
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005868717
http://id.ndl.go.jp/bib/000005868717
Bibliographic Record Category (NDL): 291