Integrated circuit tester using interferometric imaging DOE/SF/19460-T2 DE97 001495

Integrated circuit tester using interferometric imaging

DOE/SF/19460-T2 DE97 001495

Call No. (NDL): LS-DE97/001495
Bibliographic ID of National Diet Library: 000005871609

Material type: 規格・テクニカルリポート類

Author: Donaldson, W. Rほか

Publisher: -

Publication date: 1997

Material Format: Microform

Capacity, size, etc.: 4 p. (1 microfiche)

NDC: -

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Microform

Material Type: 規格・テクニカルリポート類
Title: Integrated circuit tester using interferometric imaging
Author/Editor: Donaldson, W. R
Michaels, E. M. R
Akowuah, K
Publication Date: 1997
Publication Date (W3CDTF): 1997
Extent: 4 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : DOE/SF/19460-T2
テクニカルリポート番号 : DE97 001495
Holding library: 国立国会図書館
Call No.: LS-DE97/001495
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005871609
http://id.ndl.go.jp/bib/000005871609
Bibliographic Record Category (NDL): 291