Seventh workshop on the role of impurities and defects in silicon device processing NREL/CP-520-23386 DE97 008527 CONF-970875

Seventh workshop on the role of impurities and defects in silicon device processing

NREL/CP-520-23386 DE97 008527 CONF-970875

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Material Type: 規格・テクニカルリポート類
Title: Seventh workshop on the role of impurities and defects in silicon device processing
Publication Date: 1997
Publication Date (W3CDTF): 1997
Extent: 243 p. (3 microfiches)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : NREL/CP-520-23386
テクニカルリポート番号 : DE97 008527
テクニカルリポート番号 : CONF-970875
Holding library: 国立国会図書館
Call No.: LS-DE97/008527
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005872148
http://id.ndl.go.jp/bib/000005872148
Bibliographic Record Category (NDL): 291