Mechanisms for enhanced packaging and/or burn-in total dose sensitivity in microelectronics SAND-97-0603C DE97 003730 CONF-9709342

Mechanisms for enhanced packaging and/or burn-in total dose sensitivity in microelectronics

SAND-97-0603C DE97 003730 CONF-9709342

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Material Type: 規格・テクニカルリポート類
Title: Mechanisms for enhanced packaging and/or burn-in total dose sensitivity in microelectronics
Author/Editor: Pease, R. L
Shaneyfelt, M
Winokur, P
Publication Date: 1997
Publication Date (W3CDTF): 1997
Extent: 5 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : SAND-97-0603C
テクニカルリポート番号 : DE97 003730
テクニカルリポート番号 : CONF-9709342
Holding library: 国立国会図書館
Call No.: LS-DE97/003730
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005872236
http://id.ndl.go.jp/bib/000005872236
Bibliographic Record Category (NDL): 291