Single event upset tests of a RISC-based fault-tolerant computer UCRL-ID-117471 DE97 053111

Single event upset tests of a RISC-based fault-tolerant computer

UCRL-ID-117471 DE97 053111

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Material Type: 規格・テクニカルリポート類
Title: Single event upset tests of a RISC-based fault-tolerant computer
Author/Editor: Kimbrough, J. R
Butner, D. N
Colella, N. J
Kaschmitter, J. L
Shaeffer, D. L
Publication Date: 1996
Publication Date (W3CDTF): 1996
Extent: 17 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : UCRL-ID-117471
テクニカルリポート番号 : DE97 053111
Holding library: 国立国会図書館
Call No.: LS-DE97/053111
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005872509
http://id.ndl.go.jp/bib/000005872509
Bibliographic Record Category (NDL): 291