SWEPP PAN assay system uncertainty analysis: Passive mode measurements of graphite waste INEEL/EXT-97-00812 DE98 050364

SWEPP PAN assay system uncertainty analysis: Passive mode measurements of graphite waste

INEEL/EXT-97-00812 DE98 050364

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Material Type: 規格・テクニカルリポート類
Title: SWEPP PAN assay system uncertainty analysis: Passive mode measurements of graphite waste
Author/Editor: Blackwood, L. G
Harker, Y. D
Meachum, T. R
Yoon, W. Y
Publication Date: 1997
Publication Date (W3CDTF): 1997
Extent: 80 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : INEEL/EXT-97-00812
テクニカルリポート番号 : DE98 050364
Holding library: 国立国会図書館
Call No.: LS-DE98/050364
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005877611
http://id.ndl.go.jp/bib/000005877611
Bibliographic Record Category (NDL): 291