Application specific Tester-On-a-Resident-Chip (TORCH(trademark)) - innovation in the area of semiconductor testing SAND-97-2946 DE98 001735

Application specific Tester-On-a-Resident-Chip (TORCH(trademark)) - innovation in the area of semiconductor testing

SAND-97-2946 DE98 001735

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Material Type: 規格・テクニカルリポート類
Title: Application specific Tester-On-a-Resident-Chip (TORCH(trademark)) - innovation in the area of semiconductor testing
Author/Editor: Bowles, M
Peterson, T
Savignon, D
Campbell, D
Publication Date: 1997
Publication Date (W3CDTF): 1997
Extent: 70 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : SAND-97-2946
テクニカルリポート番号 : DE98 001735
Holding library: 国立国会図書館
Call No.: LS-DE98/001735
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005877871
http://id.ndl.go.jp/bib/000005877871
Bibliographic Record Category (NDL): 291