Characterization of nodular and thermal defects in hafnia/silica multilayer coatings using optical, photothermal, and atomic force microscopy UCRL-JC-128046 DE98 052073 CONF-9710116

Characterization of nodular and thermal defects in hafnia/silica multilayer coatings using optical, photothermal, and atomic force microscopy

UCRL-JC-128046 DE98 052073 CONF-9710116

Call No. (NDL): LS-DE98/052073
Bibliographic ID of National Diet Library: 000005879136

Material type: 規格・テクニカルリポート類

Author: Stolz, C. Jほか

Publisher: -

Publication date: 1997

Material Format: Microform

Capacity, size, etc.: 12 p. (1 microfiche)

NDC: -

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Material Type: 規格・テクニカルリポート類
Title: Characterization of nodular and thermal defects in hafnia/silica multilayer coatings using optical, photothermal, and atomic force microscopy
Author/Editor: Stolz, C. J
Yoshiyama, J. M
Salleo, A
Wu, Z. L
Green, J
Publication Date: 1997
Publication Date (W3CDTF): 1997
Extent: 12 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : UCRL-JC-128046
テクニカルリポート番号 : DE98 052073
テクニカルリポート番号 : CONF-9710116
Holding library: 国立国会図書館
Call No.: LS-DE98/052073
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005879136
http://id.ndl.go.jp/bib/000005879136
Bibliographic Record Category (NDL): 291