Evaluation of temperature-enhanced gain degradation of vertical npn and lateral pnp bipolar transistors SAND-97-0493C DE97 004377 CONF-9707113

Evaluation of temperature-enhanced gain degradation of vertical npn and lateral pnp bipolar transistors

SAND-97-0493C DE97 004377 CONF-9707113

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 規格・テクニカルリポート類
Title: Evaluation of temperature-enhanced gain degradation of vertical npn and lateral pnp bipolar transistors
Author/Editor: Witczak, S. C
Lacoe, R. C
Galloway, K. F
Publication Date: 1997
Publication Date (W3CDTF): 1997
Extent: 5 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : SAND-97-0493C
テクニカルリポート番号 : DE97 004377
テクニカルリポート番号 : CONF-9707113
Holding library: 国立国会図書館
Call No.: LS-DE97/004377
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005883237
http://id.ndl.go.jp/bib/000005883237
Bibliographic Record Category (NDL): 291