Latent interface traps and 1/f noise in irradiated MOS devices SAND-97-0348C DE97 003212 CONF-97071113

Latent interface traps and 1/f noise in irradiated MOS devices

SAND-97-0348C DE97 003212 CONF-97071113

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Material Type: 規格・テクニカルリポート類
Title: Latent interface traps and 1/f noise in irradiated MOS devices
Author/Editor: Fleetwood, D. M
Johnson, M. J
Publication Date: 1997
Publication Date (W3CDTF): 1997
Extent: 6 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : SAND-97-0348C
テクニカルリポート番号 : DE97 003212
テクニカルリポート番号 : CONF-97071113
Holding library: 国立国会図書館
Call No.: LS-DE97/003212
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005884466
http://id.ndl.go.jp/bib/000005884466
Bibliographic Record Category (NDL): 291