Single event gate rupture in thin gate oxides SAND-97-0426C DE97 003202 CONF-97071111

Single event gate rupture in thin gate oxides

SAND-97-0426C DE97 003202 CONF-97071111

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Material Type: 規格・テクニカルリポート類
Title: Single event gate rupture in thin gate oxides
Author/Editor: Sexton, F. W
Fleetwood, D. M
Shaneyfelt, M. R
Dodd, P. E
Hash, G. L
Publication Date: 1997
Publication Date (W3CDTF): 1997
Extent: 6 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : SAND-97-0426C
テクニカルリポート番号 : DE97 003202
テクニカルリポート番号 : CONF-97071111
Holding library: 国立国会図書館
Call No.: LS-DE97/003202
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005884468
http://id.ndl.go.jp/bib/000005884468
Bibliographic Record Category (NDL): 291