Atom probe field ion microscopy of high resistivity materials ORNLCP96507 DE98 005023 CONF980713

Atom probe field ion microscopy of high resistivity materials

ORNLCP96507 DE98 005023 CONF980713

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Material Type: 規格・テクニカルリポート類
Title: Atom probe field ion microscopy of high resistivity materials
Author/Editor: Sibrandij, S. J
Larson, D. J
Miller, M. K
Publication Date: 1998
Publication Date (W3CDTF): 1998
Extent: 4 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : ORNLCP96507
テクニカルリポート番号 : DE98 005023
テクニカルリポート番号 : CONF980713
Holding library: 国立国会図書館
Call No.: LS-DE98/005023
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005897431
http://id.ndl.go.jp/bib/000005897431
Bibliographic Record Category (NDL): 291