規格・テクニカルリポート類

Investigation of epitaxial silicon layers as a material for radiation hardened silicon detectors BNL64973983REV DE98 004434

Icons representing 規格・テクニカルリポート類

Investigation of epitaxial silicon layers as a material for radiation hardened silicon detectors

BNL64973983REV DE98 004434

Call No. (NDL)
LS-DE98/004434
Bibliographic ID of National Diet Library
000005897561
Material type
規格・テクニカルリポート類
Author
Li, Zほか
Publisher
-
Publication date
1997
Material Format
Microform
Capacity, size, etc.
9 p. (1 microfiche)
NDC
-
View All

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Microform

Material Type
規格・テクニカルリポート類
Author/Editor
Li, Z
Eremin, V
Ilyashenko, I
Ivanov, A
Verbitskaya, E
Publication Date
1997
Publication Date (W3CDTF)
1997
Extent
9 p. (1 microfiche)
Note (Material Type)
[microform]
Report No.
テクニカルリポート番号 : BNL64973983REV
テクニカルリポート番号 : DE98 004434
Holding library
国立国会図書館
Call No.
LS-DE98/004434