Rapid yield learning through optical defect and electrical test analysis ORNLCP96817 DE98 005062

Rapid yield learning through optical defect and electrical test analysis

ORNLCP96817 DE98 005062

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Material Type: 規格・テクニカルリポート類
Title: Rapid yield learning through optical defect and electrical test analysis
Author/Editor: Gleason, S. S
Tobin, K. W
Karnowski, T. P
Lakhani, F
Publication Date: 1998
Publication Date (W3CDTF): 1998
Extent: 14 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : ORNLCP96817
テクニカルリポート番号 : DE98 005062
Holding library: 国立国会図書館
Call No.: LS-DE98/005062
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005918354
http://id.ndl.go.jp/bib/000005918354
Bibliographic Record Category (NDL): 291